Interactive web analysis and presentation of computer-controlled scanning electron microscopy data

Authors

  • Peter Riisager Geological Survey of Denmark and Greenland, Øster Voldgade 10, DK-1350 Copenhagen K. Denmark
  • Nynke Keulen Geological Survey of Denmark and Greenland, Øster Voldgade 10, DK-1350 Copenhagen K. Denmark
  • Uffe Larsen Geological Survey of Denmark and Greenland, Øster Voldgade 10, DK-1350 Copenhagen K. Denmark
  • Roger K. McLimans DuPont Titanium Technologies, Experimental Station, E352/217, Route 141 and Henry Clay, Wilmington, DE 19808, USA
  • Christian Knudsen Geological Survey of Denmark and Greenland, Øster Voldgade 10, DK-1350 Copenhagen K. Denmark
  • Jørgen Tulstrup Geological Survey of Denmark and Greenland, Øster Voldgade 10, DK-1350 Copenhagen K. Denmark

DOI:

https://doi.org/10.34194/geusb.v20.4994

Abstract

In the following we describe the result of the Titan Project, an interactive web application (Titan) developed at the Geological Survey of Denmark and Greenland (GEUS) together with DuPont Titanium Technologies. The main aim of Titan is to make computer-controlled scanning electron microscopy (CCSEM) data, generated at GEUS, available via the internet. In brief, CCSEM is a method automatically to detect particles with a scanning electron microscope (SEM), and based on computer-controlled imagery to measure the chemistry and grain morphology of each particle in a given sample (Knudsen et al. 2005; Bernstein et al. 2008); Keulen et al. 2008. Titan makes data available on-line so that the user can interact with the data sets and analyse them using a web browser. In addition to CCSEM data, Titan contains a global database of titanium deposits and various reports. The web application is customised, such that the functionality and amount of data available for a given user depend on the privileges of that user.

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Published

2010-07-07

How to Cite

Riisager, P., Keulen, N., Larsen, U., McLimans, R. K., Knudsen, C., & Tulstrup, J. (2010). Interactive web analysis and presentation of computer-controlled scanning electron microscopy data. GEUS Bulletin, 20, 103–106. https://doi.org/10.34194/geusb.v20.4994

Issue

Section

RESEARCH ARTICLE | SHORT

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